Email: fhpbc@cunyvm.cuny.edu
Phone: (718) 951 5356
Fax:(718) 951 4871

Distinguished Professor of Physics at Brooklyn College and the Graduate Center of the City University of New York
Director, Semiconductor Institute at Brooklyn College
Deputy Director of the New York State Center for Advanced Technology in Ultrafast Photonic Materials and Applications at the City University of New York
Director and Fellow, Society of Photo-Optical Instrumentation Engineers
Fellow, American Physical Society
Ph.D. (Physics) University of Chicago, 1964

Research Interests

• Optical properties of solids
  
• Modulation spectroscopy including studies of semiconductors, semiconductor microstructures, semiconductor surfaces/interfaces and semiconductor devices
  
• In-situ monitoring of semiconductor growth/processing
  
• Growth and characterization of diamondlike nanocomposite thin films
  
• Raman scattering
  
• Effects of uniaxial stress on the optical and transport properties of semiconductors and semiconductor microstructures
  

Selected Recent Publications

1. Pollak, F.H., "Effects of Homogeneous Strain on the Electronic and Vibrational Levels in Semiconductors" in Semiconductors and Semimetals, Vol. 32, ed. by T.P. Pearsall (Academic, New York, 1990) p. 17.
2. Pollak, F.H., "Characterization of Semiconductors by Raman Spectroscopy", in Analytical Raman Spectroscopy, ed. by J.C. Grasselli and B.J. Bulkin (John Wiley and Sons, New York, 1991) p. 137.
3. Pollak, F.H. and Shen, H., "Quantum Wells: Intrinsic Optical Properties",in Concise Encyclopedia of Semiconductor Materials and Related Technologies ed. by S. Mahajan and L.C. Kimmerling(Pergamon, New York, 1992) p.388.
4. Shen, H. and Pollak, F.H., "Quantum Wells: Semiconductors", in Concise Encyclopedia of Semiconductor Materials and Related Technologies ed. by S. Mahajan and L.C. Kimmerling(Pergamon, New York, 1992) p.385.
5. Pollak, F.H., "Modulation Spectroscopy",in Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films, ed. by C. Evans, R. Brundle and S. Wilson (Butterworth-Heinemann, Boston, 1992) p.385.
6. Pollak, F.H. and Shen, H., "Modulation Spectroscopy of Semiconductors: Bulk/Thin Film, Microstructures, Surfaces/Interfaces and Devices", Materials Science and Engineering R10, 275(1993).
7. Qiang, H., Yan, D., Yin, Y. and Pollak, F.H., "Modulation Spectroscopy Characterization of Semiconductor Device Structures", Asia-Pacific Engineering Journal, Part A: Electrical Engineering 3, 167 (1993).
8. Pollak, F.H., Qiang,H., Yan, D., Yin, Y., and Boccio, V.T., "Better Device Yields with Modulation Spectroscopy", Photonics Spectra Magazine, Vol. 27, Issue 8, August 1993, p. 78.
9. Pollak,F.H. and Qiang, H., "External and/or Internal Stress Effects on the Optical Properties of Semiconductor Microstructures", Japn. J. Appl. Phys. 32, Suppl. 32-1, 101 (1993).
10. Pollak, F.H., "Modulation Spectoscopy of Semiconductor and Semiconductor Microstructures", Handbook on Semiconductors, Vol.2 "Optical Properties of Semiconductors", ed. by M. Balkanski (North Holland, Amsterdam, 1994) p. 527.
11. Pollak, F.H., "Electromodulation Spectroscopy of Semiconductor Surfaces and Interfaces", to be published in Photonic Probes of Surfaces, ed. by P. Halevi (North-Holland, New York, 1994).
12. Pollak, F.H., Qiang, H., Yan, D., Yin, Y. and Krystek, W., "Analyzing semiconductor devices using modulation spectroscopy", Journal of Metals 46, 55 (1994).
13. Pollak, F.H., Qiang, H., Yan, D., Yin, Y. and Woodall, J.M., "Contactless electromodulation for the characterization of semiconductor surfaces/interfaces", Control of Semiconductor Interfaces; Proceedings of the First International Symposium on Control of Semiconductor Interfaces, Karuiza-wa, Japan, eds. I. Ohdomari, M. Oshima and A. Hiraki (Elsevier, Amsterdam, 1994) p. 307.
14. Pollak, F.H., Qiang, H., Yan, D., Yin, Y., Krystek, W. and Moneger, S., "Contactless electromodulation for the characterization of semiconductor device structures", Proceedings of the ECS Symposium on Diagnostic Techniques for Semiconductor Materials and Devices, (Electrochemical Society, Pennington, 1995) ed. by D. Schroder, J. Benton and J. Rai-Choudhury, ECS Proc. 94-33, 228 (1994).
15. Qiang, H., Yan, D., Yin, Y. and Pollak, F.H., "Characterization of semiconductor device structures by modulation spectroscopy", Proc. SPIE. 2141, 58 (1994).
16. Melloch, M.R., Woodall, J.M., Harmon, E.S., Otsuka, N., Pollak, F.H. and Nolte, D.D., "Low Temperature Grown III-V Materials", Annual Review of Materials Science, edited by B.W. Wessels, E.N. Kaufman, J.A. Giordmaine and J.B. Wachtman, Jr. Vol. 25, pg 547 (1995).
17. Pollak, F.H., Qiang, H., Yan, D., Krystek, W. and Moneger, S., "Nondestructive, Room Temperature Analysis/Qualification of Wafer-Sized Semiconductor Device Stuctures using Contactless Electromodulation Spectroscopy", Solid State Electronics, 38, 1121 (1995).
18. Pollak, F.H., Krystek, W., Moneger, S., Qiang, H. and Yan, D., "Characterization of semiconductor device structures using contactless electromodulation", Proc. SPIE, 2397, 92 (1995).
19. Pollak, F.H., "Modulation Spectroscopy of Quantum Wells and Superlattices", to be published in DATAREVIEWS on Properties of III-V Superlattices and Quantum Wells.